🏆 Finalist — NIH Data Sharing Index (“S-Index”) Challenge

David M. Lynn

University of Wisconsin–Madison

ORCID: 0000-0002-3140-8637
Materials ScienceBiochemistry, Genetics and Molecular Biology

Pilot corpus only

This score is computed over theSindex pilot corpus and does not cover the full scientific literature. Scores are relative to papers we have ingested — papers, authors, and institutions outside the pilot are not represented. Methodology.

Top 100%percentile
0Author DataRank

Indexed papers

0in pilot corpus
datarank_citation_only_1hop_v6· scope data_onlyMethodology

Papers

Driven by 15 papers. Top paper: Fabrication of Slippery Liquid-Infused Coatings in Flexible Narrow-Bore Tubing.

16 citations

Kayleigh E. Nyffeler, Helen E. Blackwell, David M. Lynn, Harshit Agarwal

8 citations

Reid C. Van Lehn, Helen E. Blackwell, David M. Lynn, Curran G. Gahan

13 citations

Thomas J. Polaske, Gabriel Sánchez-Velázquez, Helen E. Blackwell, David M. Lynn, Harshit Agarwal

11 citations

Curran G. Gahan, Kayleigh E. Nyffeler, David M. Lynn, Helen E. Blackwell, Thomas J. Polaske

30 citations

Benjamin D. Gastfriend, Benjamin J. Umlauf, David M. Lynn, Eric V. Shusta, Ye Zhou

19 citations

Curran G. Gahan, Patricia R. Kierski, Diego F. Calderon, Ke Zhao, Charles J. Czuprynski +4 more

2 citations

Visham Appadoo, Jun Ren, Timothy A. Hacker, Bo Liu, David M. Lynn +1 more

6 citations

Reid C. Van Lehn, Helen E. Blackwell, David M. Lynn, Curran G. Gahan

1 citations

Curran G. Gahan, Patricia R. Kierski, Diego F. Calderon, Ke Zhao, Charles J. Czuprynski +4 more

15 citations

Myung‐Ryul Lee, Nathan Wang, David M. Lynn, Sean P. Palecek, Douglas H. Chang

2 citations

Douglas H. Chang, Alexios Stamoulis, George W. Huber, David M. Lynn, Sean P. Palecek +2 more

0 citations

Joshua Richardson, Myung‐Ryul Lee, David M. Lynn, Sean P. Palecek, Reid C. Van Lehn +1 more

12 citations

Joshua Richardson, Myung‐Ryul Lee, David M. Lynn, Sean P. Palecek, Reid C. Van Lehn +1 more

1 citations

Joshua Richardson, Myung‐Ryul Lee, David M. Lynn, Sean P. Palecek, Reid C. Van Lehn +1 more