R. Michael Verkouteren
National Institute of Standards and Technology
ORCID: 0000-0002-5155-9926Also affiliated with Material Measurement Laboratory
Environmental SciencePhysics and AstronomyChemistry
Pilot corpus only
This score is computed over theSindex pilot corpus and does not cover the full scientific literature. Scores are relative to papers we have ingested β papers, authors, and institutions outside the pilot are not represented. Methodology.
Top 100%percentile
Indexed papers
0in pilot corpus
Papers
Driven by 2 papers. Top paper: βGravimetric drop-on-demand inkjet deposition for imaging phantoms with traceable activityβ.
N/A
5 citations
Denis E. Bergeron, R. Michael Verkouteren, Svetlana Nour, Ryan Fitzgerald, Ohyun Kwon +5 more
1 citations
Denis E. Bergeron, Andrew T Nupp, R. Michael Verkouteren, Svetlana Nour, Ryan Fitzgerald +6 more