John H. Day
Massachusetts Institute of Technology
ORCID: 0000-0002-5515-6606Pilot corpus only
This score is computed over theSindex pilot corpus and does not cover the full scientific literature. Scores are relative to papers we have ingested β papers, authors, and institutions outside the pilot are not represented. Methodology.
Indexed papers
Papers
Driven by 5 papers. Top paper: βHigh-throughput expansion microscopy enables scalable super-resolution imagingβ.
Catherine M Della Santina, Pema Maretich, Alexander L. Auld, Kirsten K Schnieder, Tay Shin +3 more
John H. Day, Amanda J. Haack, Ross C. Bretherton, Wenbo Lu, Cole A. DeForest +3 more
Catherine Marin Della Santina, Pema Maretich, Alexander L. Auld, Kirsten K Schnieder, Tay Shin +3 more
Catherine Marin Della Santina, Pema Maretich, Alexander L. Auld, Kirsten K Schnieder, Tay Shin +3 more
Catherine Marin Della Santina, Pema Maretich, Alexander L. Auld, Kirsten K Schnieder, Tay Shin +3 more