πŸ† Finalist β€” NIH Data Sharing Index (β€œS-Index”) Challenge

Shin Muramoto

National Institute of Standards and Technology

ORCID: 0000-0003-3135-375X

Also affiliated with Material Measurement Laboratory

EngineeringChemistryMaterials Science

Pilot corpus only

This score is computed over theSindex pilot corpus and does not cover the full scientific literature. Scores are relative to papers we have ingested β€” papers, authors, and institutions outside the pilot are not represented. Methodology.

Top 100%percentile
0Author DataRank

Indexed papers

0in pilot corpus
datarank_citation_only_1hop_v6Β· scope data_onlyMethodology

Papers

Driven by 2 papers. Top paper: β€œToF-SIMS analysis of ultrathin films and their fragmentation patterns”.

ToF-SIMS analysis of ultrathin films and their fragmentation patterns

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films(2024)10.1116/6.0003249
N/A
0.269DataRank Β· unranked
5 citations

Daniel J. Graham, David G. Castner, Shin Muramoto

0 citations

Felix I. Simonovsky, J. Brison, Shin Muramoto, Buddy D. Ratner, David G. Castner +1 more