Shin Muramoto
National Institute of Standards and Technology
ORCID: 0000-0003-3135-375XAlso affiliated with Material Measurement Laboratory
EngineeringChemistryMaterials Science
Pilot corpus only
This score is computed over theSindex pilot corpus and does not cover the full scientific literature. Scores are relative to papers we have ingested β papers, authors, and institutions outside the pilot are not represented. Methodology.
Top 100%percentile
Indexed papers
0in pilot corpus
Papers
Driven by 2 papers. Top paper: βToF-SIMS analysis of ultrathin films and their fragmentation patternsβ.
N/A
5 citations
Daniel J. Graham, David G. Castner, Shin Muramoto
0 citations
Felix I. Simonovsky, J. Brison, Shin Muramoto, Buddy D. Ratner, David G. Castner +1 more