Tino Hofmann
New Jersey Institute of Technology
ORCID: 0000-0003-3362-9959Physics and AstronomyMaterials ScienceEngineering
Pilot corpus only
This score is computed over theSindex pilot corpus and does not cover the full scientific literature. Scores are relative to papers we have ingested β papers, authors, and institutions outside the pilot are not represented. Methodology.
Top 100%percentile
Indexed papers
0in pilot corpus
Papers
Driven by 1 paper. Top paper: βComplex dielectric function of thiazolothiazole thin films determined by spectroscopic ellipsometryβ.
5 citations
Jackson Mower, V. Paige Stinson, Micheal McLamb, Glenn D. Boreman, Michael G. Walter +2 more