Pilot corpus only
This score is computed over theSindex pilot corpus and does not cover the full scientific literature. Scores are relative to papers we have ingested — papers, authors, and institutions outside the pilot are not represented. Methodology.
Driven by 1 paper. Top paper: “Dual-mode on-machine metrology for SPDT tool alignment”.
Yihan Wang, Hongzhang Ma, Daodang Wang, Rongguang Liang, Wenjun Kang