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Back-Scattered Electron microscopy in Aberration corrected Electron microscope

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany10.1007/978-3-540-85156-1_22Source: DataRank Database

Back-Scattered Electron microscopy in Aberration corrected Electron microscope is a research paper published in EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany. On theSindex it has a DataRank of 0.

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›Methodology & internals

datarank_citation_only_1hop_v6· scope data_onlyMethodology

Pipeline:MetadataData-paper checkEnrichmentCitation networkScoring

Enrichment:Impact (FWCI 0.00)OA: closedTopics (22)IDs (PubMed, OpenAlex)

FAIR Checklist

Context only (not used in score)

Findable (1/2)

Has DOI

Accessible (0/2)

Interoperable (0/2)

Reusable (0/3)

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Authors (8)

Y. Kondo,H. Sawada,N. Endo,A. Yasuhara,H. Endo

Live enrichment

PubMed:21097893 OpenAlex:https://openalex.org/W176637966

FWCI

0.00

Citation Percentile

0.2%

closed

https://doi.org/10.1007/978-3-540-85156-1_22

Fields of Study

Advanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy TechniquesSurface and Thin Film Phenomena

Keywords

Scanning transmission electron microscopyElectron microscopeConventional transmission electron microscopeEnergy filtered transmission electron microscopyScanning confocal electron microscopyContrast transfer functionDark field microscopySpherical aberrationTransmission electron microscopyOpticsElectron tomographyMaterials scienceMicroscopyMicroscopeLow-voltage electron microscopeScanning electron microscopeElectronElectron beam-induced depositionPhysics

Back-Scattered Electron microscopy in Aberration corrected Electron microscope

FAIR Checklist

Authors (8)

Impact

Open Access

Topics