Selected-Area Diffraction Patterns and Magnified Laue-Diffraction Images by X-Ray Microscopy is a research paper published in Journal of Applied Physics (1968). On theSindex it has a DataRank of 0.889. It has been cited 9 times, with 6 citing works in its 1-hop citation network.
An ``x-ray microscope'' which can take both x-ray diffraction patterns and magnified Laue-diffraction images of selected areas of the specimen under microscopic observation has been constructed. Resolving power of the microscope is 0.3 μ and the minimum diameter of the selected area of the specimen is about 10 μ. A decontamination device for the target is incorporated into the instrument. Some applications of the methods of x-ray microscopy, selected-area diffraction, and magnified Laue diffraction are described. It is shown that the selected-area diffraction patterns are useful for the identification of the components of the specimen with complicated structure. It is also shown that the magnified Laue-diffraction images are useful for the study of imperfections and local distortions in crystals.
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Base Score Contribution
0.345
From this paper's citation signal
Citation Network Contribution
0.543
From 5 citing papers with measurable signal
DataRank blends this paper's own citation count with the influence of the papers that cite it. Here, roughly 39% comes from its base citations and 61% from the citation network (5 citing papers contributed measurable signal).
Citers are pulled from OpenAlex sorted by cited_by_count:descand capped per paper, so when the cap binds we keep the highest-signal references and the score is reproducible across reruns.
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