Compendium of single event failures in power MOSFETs is a research paper published in 1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385). On theSindex it has a DataRank of 2.6. It has been cited 22 times, with 18 citing works in its 1-hop citation network.
Scored on demand from live citation data
DataRank reads this dataset's downstream impact straight off the citation graph — no black box, no proprietary weighting. How is this computed?
FAIR checklist signals are shown for context only and do not affect DataRank scoring.
We only score data papers we can read in full — never from an abstract alone.
Base Score Contribution
0.470
From this paper's citation signal
Citation Network Contribution
2.1
From 13 citing papers with measurable signal
FWCI
1.78
Citation Percentile
0.8%
Citation Trend
Fields of Study
Keywords