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First-Order Speckle Statistics for the Detection of Microstructural Anisotropy

IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control(2025)10.1109/tuffc.2025.3562784Source: DataRank Database

First-Order Speckle Statistics for the Detection of Microstructural Anisotropy is a research paper published in IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control (2025). On theSindex it has a DataRank of 0. It has been cited 5 times.

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0DataRank · unranked

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Open Access5 citations

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›Methodology & internals

datarank_citation_only_1hop_v6· scope data_onlyMethodology

Pipeline:MetadataData-paper checkEnrichmentCitation networkScoring

Enrichment:Funding (4 grants)Impact (FWCI 2.58)OA: greenTopics (21)IDs (PubMed, PMC, OpenAlex)

FAIR Checklist

Context only (not used in score)

Findable (1/2)

Has DOI

Accessible (1/2)

Open Access

Interoperable (0/2)

Reusable (0/3)

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Authors (4)

Timothy J. Hall ORCID,Helen Feltovich ORCID,Iván M. Rosado-Méndez ORCID,Alexandra Christensen ORCID

Live enrichment

PubMed:40257868 PMC:PMC12264982 OpenAlex:https://openalex.org/W4409640836

Eunice Kennedy Shriver National Institute of Child Health and Human Development

Grant: R01HD096361

Eunice Kennedy Shriver National Institute of Child Health and Human Development

Grant: R01HD072077

NIH HHS

Grant: P51 OD011106

Iris Fund

FWCI

2.58

Citation Percentile

0.9%

Citation Trend

2025

2026

greenLicense: https://doi.org/10.15223/policy-029

repositoryhttps://pmc.ncbi.nlm.nih.gov/articles/PMC12264982/

publisherhttp://xplorestaging.ieee.org/ielx8/58/11018082/10971727.pdf?arnumber=10971727

journalhttps://doi.org/10.1109/tuffc.2025.3562784

repositoryhttps://pubmed.ncbi.nlm.nih.gov/40257868

Fields of Study

Optical measurement and interference techniquesSpectroscopy and Chemometric AnalysesIndustrial Vision Systems and Defect DetectionMedicineEngineering

MeSH Terms

AlgorithmsAnimalsImage Processing, Computer-AssistedSheepUltrasonographyAnisotropyPhantoms, Imaging

Keywords

Speckle patternAnisotropyMaterials scienceHigher-order statisticsOpticsPhysicsSignal processingElectronic engineeringEngineering