Pilot corpus only
This score is computed over theSindex pilot corpus and does not cover the full scientific literature. Scores are relative to papers we have ingested — papers, authors, and institutions outside the pilot are not represented. Methodology.
Top 100%percentile
Indexed papers
0in pilot corpus
Papers
Driven by 2 papers. Top paper: “Atomic Force Microscope Characterization of the Bending Stiffness and Surface Topography of Silicon and Polymeric Electrodes”.
Atomic Force Microscope Characterization of the Bending Stiffness and Surface Topography of Silicon and Polymeric Electrodes
2022 44th Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC)(2022)10.1109/embc48229.2022.9871216
N/A
0 citations
Wen Li, Erin K. Purcell, Ti’Air E. Riggins
3 citations
Quentin A. Whitsitt, Akash Saxena, Emani Hunter, Bradley Hunt, Cort H. Thompson +3 more