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Atomic Force Microscope Characterization of the Bending Stiffness and Surface Topography of Silicon and Polymeric Electrodes

2022 44th Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC)(2022)10.1109/embc48229.2022.9871216Source: DataRank Database

Atomic Force Microscope Characterization of the Bending Stiffness and Surface Topography of Silicon and Polymeric Electrodes is a research paper published in 2022 44th Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC) (2022). On theSindex it has a DataRank of 0.

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Enrichment:Funding (3 grants)Impact (FWCI 0.00)OA: closedTopics (33)IDs (PubMed, OpenAlex)

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Authors (3)

Wen Li ORCID,Erin K. Purcell ORCID,Ti’Air E. Riggins ORCID

Live enrichment

PubMed:36085626 OpenAlex:https://openalex.org/W4295423195

NIH

Grant: F99NS118738,ROI NS107451

NINDS NIH HHS

Grant: F99 NS118738

NINDS NIH HHS

Grant: R01 NS107451

FWCI

0.00

Citation Percentile

0.2%

closedLicense: https://doi.org/10.15223/policy-029

publisherhttp://xplorestaging.ieee.org/ielx7/9870821/9870822/09871216.pdf?arnumber=9871216

conferencehttps://doi.org/10.1109/embc48229.2022.9871216

repositoryhttps://pubmed.ncbi.nlm.nih.gov/36085626

Fields of Study

Neuroscience and Neural EngineeringAdvanced Memory and Neural ComputingConducting polymers and applicationsElectrodes, ImplantedGliosisHumansMicroelectrodesMicroscopy, Atomic ForceSilicon

MeSH Terms

Electrodes, ImplantedGliosisHumansMicroelectrodesSiliconMicroscopy, Atomic Force

Keywords

Materials scienceMicroelectrodeElectrodeSiliconMicroprobeSurface roughnessStiffnessParyleneGliosisBiomedical engineeringSurface finishOptoelectronicsCharacterization (materials science)Composite materialNanotechnologyPolymerChemistryNeuroscience

Atomic Force Microscope Characterization of the Bending Stiffness and Surface Topography of Silicon and Polymeric Electrodes

FAIR Checklist

Authors (3)

Funding (3 grants)

Impact

Open Access

Topics