Probing Surface Information of Alloy by Time of Flight-Secondary Ion Mass Spectrometer is a research paper published in Crystals (2021). On theSindex it has a DataRank of 0.406. It has been cited 14 times.
Scored on demand from live citation data
DataRank reads this dataset's downstream impact straight off the citation graph — no black box, no proprietary weighting. How is this computed?
FAIR checklist signals are shown for context only and do not affect DataRank scoring.
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Base Score Contribution
0.406
From this paper's citation signal
Citation Network Contribution
0
Citation network not refreshed for this result
This paper's DataRank is currently driven only by its base citation score. Citation network data was not refreshed for this result.
Learn more about DataRank methodology →Postdoctoral Research Foundation of China
Grant: 2019M660483
FWCI
1.37
Citation Percentile
0.8%
Citation Trend
Fields of Study
Keywords